Ultra-Low Voltage Nano-Scale Memories

Ultra-Low Voltage Nano-Scale Memories

von: Kiyoo Itoh, Masashi Horiguchi, Hitoshi Tanaka

Springer-Verlag, 2007

ISBN: 9780387688534 , 346 Seiten

Format: PDF, OL

Kopierschutz: Wasserzeichen

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Mehr zum Inhalt

Ultra-Low Voltage Nano-Scale Memories


 

Preface

6

Table of Contents

8

An Introduction to LSI Design

13

1.1. Introduction

13

1.2. Basics of LSI Devices

13

1.3. Leakage Currents

26

1.3.1. Subthreshold Current

26

1.3.2. Gate-Tunneling Current

28

1.3.3. Substrate Current

29

1.3.4. pn-Junction Current

30

1.4. Basics of CMOS Digital Circuits

31

1.4.1. CMOS Inverter

32

1.4.2. NOR and NAND Gates

33

1.4.3. Cross-Coupled CMOS Sense Amplifier

33

1.4.4. Level Shifter

35

1.4.5. Charge Pump

35

1.4.6. Ring Oscillator

36

1.5. Basics of CMOS Analog Circuit

36

1.6. Basics of Memory LSIs

44

1.6.1. Memory Chip Architectures

46

1.6.2. Memory Cells

47

1.7. Basics of DRAMs

49

1.7.1. Read Operation

50

1.7.2. Write Operation

52

1.7.3. Refresh Operation

53

1.8. Basics of SRAMs

54

1.8.1. Read Operation

54

1.8.2. Write Operation

56

1.9. Basics of Flash Memories

57

1.10. Soft Errors

68

1.11. Redundancy Techniques

69

1.12. Error Checking and Correcting (ECC) Circuit

71

1.13. Scaling Laws

72

1.13.1. Constant Electric-Field Scaling

72

1.13.2. Constant Operation-Voltage Scaling

74

1.13.3. Combined Scaling

75

1.14. Power Supply Schemes

75

1.15. Trends in Power Supply Voltages

78

1.16. Power Management for Future Memories

80

1.16.1. Static Control of Internal Supply Voltages

82

1.16.2. Dynamic Control of Internal Supply Voltages

84

1.17. Roles of On-Chip Voltage Converters

85

References

86

Ultra-Low Voltage Nano-Scale DRAM Cells

90

2.1. Introduction

90

2.2. Trends in DRAM-Cell Developments

91

2.2.1. The 1-T Cell and Related Cells

91

2.2.2. Gain Cells

93

2.3. 1-T-Based Cells

96

2.3.1. The Data-Line Arrangement

96

2.3.2. The Data-Line Precharging Scheme

98

2.4. Design of the Folded-Data-Line 1-T Cell

98

2.5. Design of the Open-Data-Line 1-T Cell

115

2.5.1. Noise-Generation Mechanism

116

2.5.2. Concepts for Noise Reduction

118

2.5.3. Data-Line Shielding Circuits

121

2.6. Design of the 2-T Cell

121

2.7. Design of Double-Gate Fully-Depleted SOI Cells

123

References

126

Ultra-Low Voltage Nano-Scale SRAM Cells

129

3.1. Introduction

129

3.2. Trends in SRAM-Cell Developments

130

3.3. Leakage Currents in the 6-T SRAM Cell

132

3.4. The Voltage Margin of the 6-T SRAM Cell

134

3.4.1. Read and Write Voltage Margin

135

3.4.2. Signal Charge

136

3.5. Improvements of the Voltage Margin of the 6-T SRAM Cell

140

3.5.1. Lithographically Symmetric Cell Layout

140

3.5.2. Power-Supply Controlled Cells

141

3.5.3. Fully-Depleted SOI Cells

145

3.6. The 6-T SRAM Cell Compared with the 1-T DRAM Cell

149

Leakage Reduction for Logic Circuits in RAMs

161

4.1. Introduction

161

4.2. Basic Concepts for Leakage Reduction of MOSTs

162

4.3. Basics of Leakage Reduction Circuits

164

4.4. Gate-Source Reverse Biasing Schemes

168

4.4.1. Gate-Source Self-Reverse Biasing

169

4.4.2. Gate-Source Offset Driving

173

4.5. Applications to RAMs

176

4.5.1. Leakage Sources in RAMs

177

4.5.2. Features of Peripheral Circuits of RAMs

179

4.5.3. Applications to DRAM Peripheral Circuits

180

4.5.4. Applications to SRAM Peripheral Circuits

186

References

189

Variability Issue in the Nanometer Era

192

5.1. Introduction

192

5.2. Vt Variation in the Nanometer Era

192

5.3. Leakage Variations

193

5.4. Speed Variations of Logic Circuits

194

5.5. Variations in Vt Mismatch of Flip-Flop Circuits

195

5.6. Solutions for the Reductions

198

References

204

Reference Voltage Generators

207

6.1. Introduction

207

6.2. The Vt-Referenced VREF Generator

208

6.3. The Vt-Difference Vt VREF Generator

211

6.4. The Bandgap V

217

6.4. The Bandgap VREF Generator

217

6.5. The Reference Voltage Converter/Trimming Circuit

226

6.6. Layout Design of V ref Generator

232

References

235

Voltage Down-Converters

238

7.1. Introduction

238

7.2. The Series Regulator

240

7.2.1. DC Characteristics

241

7.2.2. Transient Characteristics

246

7.2.3. AC Characteristics and Phase Compensation

250

7.2.4. PSRR

269

7.2.5. Low-Power Design

272

7.2.6. Applications

274

7.3. The Switching Regulator

276

7.4. The Switched-Capacitor Regulator

279

7.5. The Half -VDD Generator

284

References

288

Voltage Up-Converters and Negative Voltage Generators

291

8.1. Introduction

291

8.2. Basic Voltage Converters with Capacitor

293

8.3. Dickson-Type Voltage Multiplier

306

8.4. Switched-Capacitor (SC)-Type Voltage Multipliers

313

8.5. Comparisons between Dickson-Type and SC- Type Multipliers

315

8.6. Voltage Converters with an Inductor

319

8.7. Level Monitor

323

A8.1. Efficiency Analysis of Voltage Up-Converters A8.1.1. Dickson- Type Charge Pump Circuit

325

A8.1.2. Switched-Capacitor-Type Charge Pump Circuit

328

References

331

High-Voltage Tolerant Circuits

333

9.1. Introduction

333

9.2. Needs for High-Voltage Tolerant Circuits

333

9.3. Concepts of High-Voltage Tolerant Circuits

334

9.4. Applications to Internal Circuits

336

9.5. Applications to I/O Circuits

339

9.5.1. Output Buffers

339

9.5.2. Input Buffers

342

References

343

Index

344