Digital Noise Monitoring of Defect Origin

Digital Noise Monitoring of Defect Origin

von: Telman Aliev

Springer-Verlag, 2007

ISBN: 9780387717548 , 224 Seiten

Format: PDF

Kopierschutz: Wasserzeichen

Windows PC,Mac OSX geeignet für alle DRM-fähigen eReader Apple iPad, Android Tablet PC's

Preis: 96,29 EUR

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Digital Noise Monitoring of Defect Origin


 

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.